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Magazine Name : Ieee Design And Test Of Computers

Year : 2002 Volume number : 19 Issue: 05

Defect-Oriented Testing In The Deep-Submicron Era (Article)
Subject: Defect
Author: Jaume Segura     
page:      05 - 07
Iddq Test: Will It Survive The Dsm Challenge? (Article)
Subject: Dsm
Author: Salim Saba     
page:      08 - 17
Resistance Characterization For Weak Open Defects (Article)
Subject: Resistance
Author: Rosa Rodriguez Montanes     
page:      18 - 26
Noise Generation And Coupling Mechanism S In Deep-Submicron Ics (Article)
Subject: Noise
Author: K Arai     
page:      27 - 35
Leakage Process Variation Effects In Current Testing On Future Cmos Circuits (Article)
Subject: Current Testing
Author: K. Kesavan     
page:      36 - 43
High Defect Coverage With Low-Power Test Sequences In A Bist Environment (Article)
Subject: High Rate Wireless Data
Author: John Girard     
page:      44 - 53
Stressing In Fundamentals (Article)
Subject: Stress
Author: Robert C Aitken     
page:      54 - 55
Efficient Sequential Test Generation Based On Logic Simulation (Article)
Subject: Efficient
Author: K Sheng     
page:      56 - 64
Extending Opmisr Beyond 10x Scan Test Efficiency (Article)
Subject: Extending Healthcare'S Reach
Author: H Onodera     
page:      65 - 73
Neighborhood Selection For Iddq Outlier Screening At Water Sort (Article)
Subject: Water
Author: Gordon Robert     
page:      74 - 81
Multilevel Testability Analysis And Solutions For Integrated Bluetooth Transceivers (Article)
Subject: Multilevel Code
Author: Sule Ozev     
page:      82 - 91
Virtual Simulation Of Distributed Ip-Based Designs (Article)
Subject: Simulation
Author: Gustavson, Cem Dale     
page:      92 - 104