Your search returned 12 records. Click on the hyperlinks to view further details of Titles..
Magazine Name : Ieee Design And Test Of Computers
Year : 2002Volume number : 19Issue:05
Defect-Oriented Testing In The Deep-Submicron Era(Article) Subject:
Defect
Author:
Jaume
Segura
page:
05
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07
Iddq Test: Will It Survive The Dsm Challenge?(Article) Subject:
Dsm
Author:
Salim
Saba
page:
08
-
17
Resistance Characterization For Weak Open Defects(Article) Subject:
Resistance
Author:
Rosa Rodriguez
Montanes
page:
18
-
26
Noise Generation And Coupling Mechanism S In Deep-Submicron Ics(Article) Subject:
Noise
Author:
K
Arai
page:
27
-
35
Leakage Process Variation Effects In Current Testing On Future Cmos Circuits(Article) Subject:
Current Testing
Author:
K.
Kesavan
page:
36
-
43
High Defect Coverage With Low-Power Test Sequences In A Bist Environment(Article) Subject:
High Rate Wireless Data
Author:
John
Girard
page:
44
-
53
Stressing In Fundamentals(Article) Subject:
Stress
Author:
Robert C
Aitken
page:
54
-
55
Efficient Sequential Test Generation Based On Logic Simulation(Article) Subject:
Efficient
Author:
K
Sheng
page:
56
-
64
Extending Opmisr Beyond 10x Scan Test Efficiency(Article) Subject:
Extending Healthcare'S Reach
Author:
H
Onodera
page:
65
-
73
Neighborhood Selection For Iddq Outlier Screening At Water Sort(Article) Subject:
Water
Author:
Gordon
Robert
page:
74
-
81
Multilevel Testability Analysis And Solutions For Integrated Bluetooth Transceivers(Article) Subject:
Multilevel Code
Author:
Sule
Ozev
page:
82
-
91
Virtual Simulation Of Distributed Ip-Based Designs(Article) Subject:
Simulation
Author:
Gustavson, Cem
Dale
page:
92
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104